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Posters in Referred International Conferences, Sympoisa, and workshops in the Qaseem University
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Search Conditions: Posters in Referred International Conferences, Sympoisa, and workshops
  • Participation in Conferences, Symposia, and Workshops

    • Posters in Referred International Conferences, Sympoisa, and workshops

      • L. V. Poperenko, T. Lohner, V. S. Stashchuk, N. Q. Khánh, M. V. Vinnichenko, I. V. Yurgelevich, Essam Ramadan Shaaban, and D. Nosach.

        Ellipsometric study of ion implanted copper surface and its room temperature oxidation

        Fourth International Young Scientists Conference, Problems in Optics & High Technology Material Science (SPO), Kyiv, Ukraine, ..
        October 2003
      • L. V. Poperenko, Essam Ramadan Shaaban, N. Q. Khánh, V. S. Stashchuk, M. V. Vinnichenko, I. V. Yurgelevich, D. V. Nosach, and T. Lohner.

        Effect of ion irradiation on the optical properties and room temperature oxidation of copper surface

        Int. Conf. Spectroscopic Ellipsometry, Vienna.
        July 6-11 2003
      • P. Petrik, E. R. Shaaban, T. Lohner, G. Battistig, M. Fried, O. Polgár, and J. Gyulai.

        Ion implantation-caused damage in SiC measured by spectroscopic ellipsometry

        Int. Conf. Spectroscopic Ellipsometry, Vienna.
        July 6-11 2003
      • . V. Poperenko, T. Lohner, V. S. Stashchuk, N. Q. Khánh, M. V. Vinnichenko, I. V. Yurgelevich, Essam Ramadan Shaaban, and D. Nosach.

        Investigation of room temperature oxidation of ion implanted copper surface

        EMRS Spring Symposium, , Strasbourg, France..
        June 2003
      • P. Petrik, O.. Polgar, T. Lohner, M. Fried, N.Q. Khanh, E. R. Shaaban and J. Gyulai,.

        Ellipsometric characterization of shallow damage profiles created by Xe-implantation into silicon

        . IIT- 2002 conference, Taos, USA, IEEE proc. (2002) 63..
        2002
      • P. Petrik, O.. Polgar, T. Lohner, M. Fried, N.Q. Khanh, E. R. Shaaban and J. Gyulai,.

        Ellipsometric characterization of shallow damage profiles created by Xe-implantation into silicon

        . IIT- 2002 conference, Taos, USA, IEEE proc. (2002) 63..
        2002
      • L. V. Poperenko, T. Lohner, V. S. Stashchuk, N. Q. Khánh, M. V. Vinnichenko, I. V. Yurgelevich, Essam Ramadan Shaaban, and D. Nosach.

        Investigation of room temperature oxidation of ion implanted copper surface

        Third International Young Scientists Conference, Problems in Optics & High Technology Material Science (SPO), Kyiv, Ukraine.
        October 24-26 2002
      • Boubaker Askri.

        Optimized geometry for Monte Carlo simulation of external exposure to photons

        SousseTunisia 2d International Symposium of Spectroscopy.
        2007
 
 
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